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Tag: X-ray microscopy

Nano-defects in solar cells don’t necessarily affect electricity generation

Dec 21, 2023 (Nanowerk News) An international team of researchers led by DESY has been investigating the correlation between defects in the material and the...

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Active Learning to Reduce Data Requirements For Defect Identification in Semiconductor Manufacturing

A new technical paper titled “Exploring Active Learning for Semiconductor Defect Segmentation” was published by researchers at Agency for Science, Technology and Research (A*STAR)...

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