Zephyrnet Logo

Tag: X-ray diffraction imaging

X-ray Imaging of Silicon Die Within Fully Packaged Semiconductor Devices

A divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurementsby XRDI in the laboratory.

The post X-ray Imaging of Silicon Die Within Fully Packaged Semiconductor Devices appeared first on Semiconductor Engineering.

Top News

No posts to display

Latest Intelligence

spot_img
spot_img