Zephyrnet Logo

Tag: optical inspection

Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI4600 to Provide High Throughput and High-Precision Defect Detection on Patterned Wafers

TOKYO, Dec 6, 2023 - (JCN Newswire) - Hitachi High-Tech Corporation announced today the launch of the Hitachi Dark Field Wafer Defect Inspection System...

Top News

Startup Funding: January 2023

Quantum computing had a good month in January, collectively raising over $240 million. A significant chunk of that went to a full-stack quantum company...

Hitachi High-Tech Launches High-Throughput and High-Sensitivity Wafer Surface Inspection System LS9600

TOKYO, Dec 13, 2022 - (JCN Newswire) - Hitachi High-Tech Corporation announced today the launch of the LS9600, a new system for detecting particles...

Improving Yield With Machine Learning

Machine learning is becoming increasingly valuable in semiconductor manufacturing, where it is being used to improve yield and throughput. This is especially important in process...

The XTZ Life – CAN – cryptoartnfts

The XTZ Life creates work that is both visually stimulating, but also can be regarded as a scientific/artistic document that peers into the...

Latest Intelligence

spot_img
spot_img