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Tag: high-NA EUV

SPIE Let there be Light! High NA Kickoff! Samsung Slows? “Rapid” Decline? – Semiwiki

– High NA EUV’s coming out party – “Dawn” of the Angstrom Era– Well attended, positive vibes, not much new but good progress– Concerns...

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Hitachi High-Tech Launches the GT2000, High-Precision Electron Beam Metrology System to Meet the Needs of Semiconductor Devices Development and Mass Production in the High-NA...

TOKYO, Dec 12, 2023 - (JCN Newswire) - Hitachi High-Tech Corporation ("Hitachi High-Tech") announced today the launch of its GT2000 high-precision electron beam metrology...

The Significance of Point Spread Functions with Stochastic Behavior in Electron-Beam Lithography – Semiwiki

Electron beam lithography is commercially used to directly write submicron patterns onto advanced node masks. With the advent of EUV masks and nanometer-scale NIL...

Big Changes Ahead For Photomask Technology

The move to curvilinear shapes on photomasks is gaining steam after years of promise as a way of improving yield, lowering defectivity, and reducing...

Extension of DUV Multipatterning Toward 3nm – Semiwiki

China’s recent achievement of a 7nm-class foundry node using only DUV lithography raises the question of how far DUV lithography can be extended...

Modeling EUV Stochastic Defects With Secondary Electron Blur – Semiwiki

Extreme ultraviolet (EUV) lithography is often represented as benefiting from the 13.5 nm wavelength (actually it is a range of wavelengths, mostly ~13.2-13.8 nm),...

High-NA EUV Progress And Problems

High-NA EUV will enable logic scaling for at least the next couple process nodes. It’s complex, expensive, and a feat of optical engineering,...

High-NA Lithography Starting To Take Shape

The future of semiconductor technology is often viewed through the lenses of photolithography equipment, which continues to offer better resolution for future process nodes...

A Primer on EUV Lithography – Semiwiki

Extreme ultraviolet (EUV) lithography systems are the most advanced lithography systems in use today. This article is a basic primer on this important yet...

Etch Processes Push Toward Higher Selectivity, Cost Control

Plasma etching is perhaps the most essential process in semiconductor manufacturing, and possibly the most complex of all fab operations next to photolithography. Nearly...

SPIE 2023 – imec Preparing for High-NA EUV – Semiwiki

The SPIE Advanced Lithography Conference was held in February. I recently had the opportunity to interview Steven Scheer, vice president of advanced patterning process...

Reality Checks for High-NA EUV for 1.x nm Nodes

The “1.xnm” node on most roadmaps to indicate a 16-18 nm metal line pitch . The center-to-center spacing may be expected to be as...

Multi-Beam Mask Writers Are A Game Changer

The eBeam Initiative’s 11th annual Luminaries survey in 2022 reported strong purchasing predictions for multi-beam mask writers, enabling both EUV and curvilinear photomask growth....

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